Abstract
A novel, to the best of our knowledge, electro-optical modulation method is proposed for measuring third-order intermodulation distortion of photodetectors (PDs) based on de-coupling and de-embedding modulation distortion of modulators. The method utilizes dual parallel intensity modulation to generate electro-optical stimulus signals with fast and fine sweeping capability, and it eliminates the nonlinear impact of modulators by using low-frequency bias swing, allowing a direct extraction of the third-order output intercept point (OIP3) of PD from the combined nonlinear response contributed by both the modulators and the PD. The OIP3 of PD is frequency-swept measured with our method and compared to those with the conventional method to check for consistency. The proposed method enables a modulator-distortion-free, fast, and fine sweeping measurement of PDs using a simple system.
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