Abstract
This paper presents a method to simultaneously measure the thickness and refractive index of the thermally grown oxide (TGO) in thermal barrier coating (TBC) by using a reflective terahertz time-domain spectroscopy (THz-TDS) system. First, an optical transmission model of THz radiation in the multilayer structure of TBC is established. Owing to the different structures of TBC before and after forming the TGO layer, two different transmission models are established, respectively. Then, the experimental signals from the samples after different thermal cycles are obtained by the THz-TDS system. By fitting the experimentally measured reflected THz signals from the TBC samples to the proposed optical model using an optimization algorithm, the thickness and refractive index of the TGO are determined. In this work, four samples with different thicknesses of TGO layers are analyzed. The results of thickness of TGO layer are verified by SEM observation, and a reasonable agreement is obtained.
Published Version (
Free)
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a call