Characterizing morphology in organic systems with resonant soft X-ray scattering

Abstract

Resonant soft X-ray scattering (R-SoXS) has proven to be a highly useful technique for studying the morphology of soft matter thin films due to the large intrinsic contrast between organic materials and the anisotropic nature of the resonant electronic state transitions from which the contrast originates. This allows R-SoXS users to measure spatial composition correlations from crystalline and amorphous phases in heterogeneous organic samples, infer relative domain purity, and determine average local molecular ordering correlations. R-SoXS has been used to study the morphology of organic photovoltaics, organic thin film transistors, biological systems, and block copolymer engineering applications. The mesoscopic morphological information compliments molecular packing information determined with hard X-rays, so that complex structure–property relationships can be elucidated over a large range of length scales. Extensions of R-SoXS have also emerged that make use of more advanced sample setups or different experimental geometries than normal transmission, such as θ–2θ reflectivity or grazing incidence.