Abstract
The performance of an Al x-ray transmission photocathode was experimentally characterized by measuring the total electron yield from backsurface photocathodes of varying thickness. It was demonstrated that the backsurface electron yield is proportional to the x-ray photocurrent transmitted through the photocathode for thicknesses thicker than the optimum thickness. The optimum photocathode thickness with the highest conversion efficiency was found to be approximately 70nm at 2.963keV. An escape depth of the secondary electrons was determined to be approximately 13nm from the yield-versus-thickness data fitted with a semiempirical equation. Using this parameter, the dependence of the optimum photocathode thickness on the x-ray energy was calculated for the 30–10000eV range. As one example of imaging applications, different photoemission images in the transmission and reflection modes are also presented.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callMore From: Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films
Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
