Abstract
Crystal quality of radiation detector-grade TlBr material was analyzed by X-ray diffraction and synchrotron X-ray topography methods. The analyzed TlBr crystals were further processed for electrical characterization and current–voltage characteristics were measured at a temperature range of 210–320 K. The crystals studied in this work were grown by the Bridgman–Stockbarger process. X-ray diffraction measurements show the presence of small-angle grain boundaries in the crystals. The crystal with the most pronounced small-angle boundaries showed the lowest resistivity and the poorest spectroscopic characteristics.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callMore From: Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment
Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
