Abstract
The current paper is about the descriptions of the topography and compositional, optical and structural characteristics of cost-effective and non-toxic titanium dioxide (TiO2) thin film deposited using the chemical bath deposition (CBD) method on a glass substrate for the transparent conductive oxide layer in solar cell application. The specimens were characterized by various instrumentation techniques such as X-ray diffraction (XRD), ultraviolet (UV)–visible–near-infrared spectrometry and field emission scanning electron microscopy (FESEM) coupled with elemental analysis (energy-dispersive X-ray spectroscopy). The XRD results indicated a perfect polycrystalline titanium dioxide phase. UV spectrophotometry of the titanium dioxide thin film found a bandgap of 3.2 eV. At a glance, the morphology of the film by FESEM shows that the deposited film is crack-free and is deposited uniformly. The thickness of titanium dioxide is measured to be approximately equal to 100 nm.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
