Abstract
Characterization of thin-film adhesion with the scanning acoustic microscope : Addison, R.C. Jr.; Somekh, M.; Rowe, J.M.; Briggs, G.A.D. An International Symposium on Pattern Recognition and Acoustical Imaging, Newport Beach, California (United States), 4–6 Feb. 1987. pp. 275–284. Proceedings of the SPIE — The International Society for Optical Engineering, Vol. 768 (1987)
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