Characterization of thin fullerene/cadmium telluride films and their stability under x-ray radiation by IR spectroscopy

Abstract

Thin films based on fullerene with an impurity of cadmium telluride (CdTe) obtained by the methods of thermal evaporation in vacuum are promising for use in organic micro- and opto-electronics. The change in the characteristics of these materials under the influence of various special effects has not been studied in detail. In this study, infrared spectroscopy, scanning electron microscopy, and energy-dispersive microanalysis were used to study thin films of fullerene/cadmium telluride nanocomposites as well as the effect of x-ray irradiation. Thin films containing a composite mixture of fullerene C60 and an inorganic donor CdTe in various ratios were obtained by thermal evaporation in vacuum from a Knudsen cell and by the open-source volume method. The presence of Cd-O and Te-O bonds, oligomerized fullerene states, indicated that the impurity atoms interacted predominantly with oxygen or water vapor. The stability of the nanocomposite films under x-ray irradiation was demonstrated.