Abstract
In this paper we present a study of the pressure-concentration ( P− C) isotherms and the resistance properties of evaporated palladium films to which hydrogen has been added in situ at 27 °C. Hydrogen was introduced into the samples via the gas phase and the equilibrium H Pd ratio was determined using a quartz-crystal mass monitor. We find that the P− C function is highly dependent on film thickness, with the slope of the α + β coexistence region increasing and the limiting β-phase concentration decreasing with decreasing film thickness. However, the P− C function does approach bulk behavior for thick films ( t > 1000 A ̊ ). Film resistance was measured as hydrogen was cycled in and out of annealed and unannealed films. The annealed films show reversible electrical behavior with respect to hydrogen cycling; unannealed films are also electrically reversible in the α phase but show a monotonie decrease in resistance with cycling of hydrogen concentration through the β phase. For the unannealed films the ratio of the film resistance after maximum hydrogen uptake (β phase at a hydrogen pressure of 60 Torr) to the vacuum film resistance increases with cycling. This ratio never exceeds that for the annealed films.
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