Characterization of the growth processes and magnetic properties of thin ferromagnetic cobalt films on Cu(100)

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The growth of thin films of fcc cobalt on Cu(100) has been characterized with medium energy electron diffraction (MEED) and thermal energy atom scattering (TEAS) in order to prepare films of reproducible structural perfection, interdiffusion profile and atomic concentration. The magnetic properties of thin films are shown to be strongly affected by these — usually difficult to control — parameters providing a clue to the possible origin of contradictory reports in this field. In particular, for carefully grown films, a clear thickness dependence of the Curie temperature, not previously reported for this system, has been found.