Abstract

Electron diffraction allows the measurement of the orientation of small volumes in crystals by means of TEM Kikuchi-line patterns with high accuracy (±0.01° for the rotation about an axis in the image plane and ±0.1° for the rotation about the normal on this plane). The procedure, which is based on the analysis of the intersections of Kikuchi lines, is applied for the determination of misorientations in cell-block structures and disclination configurations in plastically deformed metals (Ni, Cu, α-Fe, W, and α-Ti).

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