Characterization of sediment reference materials by x-ray photoelectron spectroscopy

Abstract

The chemical composition of surface layers of three sediment reference materials, Pond Sediment (Japan NIES CRM No. 2), River Sediment (US NBS SRM 1645) and Estuarine Sediment (US NBS SRM 1646), has been studied comparatively by X-ray photoelectron spectroscopy (XPS). The composition of River Sediment as determined by XPS is peculiar in that the concentration of Cr is much higher but that of Si is much lower than that expected from the bulk composition of the sample. This can be attributed to the structure of the sediment particles, which consist of silica-rich cores covered by surface layers rich in Cr(III). Organic substances are predominant in the surface layers of all three materials, as indicated by the C 1s and N 1s lines. The elemental composition of the surface layers can be reasonably related to the origin of the sediments. The bonding states of some elements in the sediment samples, deduced from the photoelectron binding energies, are briefly discussed.