Characterization of Porous Carbonaceous Resins by Electron and Scanning Probe Microscopies

Abstract

Abstract Atomic Force and Scanning Tunneling Microscopies has captured the imagination and interest of many scientists around the world. These techniques, collectively called Scanning Probe Microscopies have developed in a number of directions capable of imaging Angstrom to micron sized features. The advantages of low cost, versatility, and simplicity of use has stimulated their development and acceptance as a research tool. As with any new technique, the application and acceptance of the results is rarely immediate. Through the comparison of the results from the newer techniques to those from the older, the contributions of the new technique can be evaluated and accepted. This presentation will focus on the use and comparison of Electron Microscopy (Scanning Electron Microscopy and Transmission Electron Microscopy) and Scanning Probe techniques (Atomic Force Microscopy, and Scanning Tunneling Microscopy) for the characterization of porous carbonaceous resins from the Angstrom to micron size scale. Particular emphasis will be placed on relating the morphology of the interior and exterior structures of the resin with transport mechanisms of solutes throughout the resin.