Abstract
Characterization of Oxide Layers on Stainless Steel Using Auger Electron Spectroscopy (AES), Scanning Electron Microscopy-Focused Ion Beam (SEM-FIB) and Transmission Electron Microscopy (TEM)
Full Text 
Sign-in/Register to access full text options
Sign-in/Register to access full text options 
Published version (
Free)
Free) 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callMore From: Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada
Paper Title
Journal
Date
