Abstract
This article describes an electric-field measurement system that is based on electro-optic sampling (EOS). This system is able to map near- and far-field patterns of millimeter waves radiated from antennas by scanning the electric-field sensor probe. With the bandwidth set to more than 150 GHz, it can detect an electric field of less than 1.0 V/m at 60 GHz. This electric field is about one-tenth the field limit detectable by conventional microwave EOS systems. A comparison of measured and calculated electric fields in both the frequency- and time-domains demonstrates the accuracy and usefulness of the system. © 2004 Wiley Periodicals, Inc. Int J RF and Microwave CAE 14: 290–297, 2004.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a call
