Characterization of Grown-in Dislocations in Benzophenone Single Crystals by X-Ray Topography

Abstract

Benzophenone single crystals were grown by the Czochralski method. The dislocations introduced during the crystal growth were examined using X-ray topography. Double images of single dislocations were found on the topographs taken in some reflection planes. The Burgers vector of predominant grown-in dislocations was estimated from analysis of the dislocation images on the basis of kinematical theory.