Characterization of frequency-selective surface spatial filters in a rectangular waveguide

Abstract

The possibility to characterize infinite and periodic frequency-selective surfaces (FSS) filters that have two orthogonal axes of symmetry inside a waveguide is reported. Thus, preliminary measurements can rapidly be obtained at low cost with few elementary cells instead of using a large FSS panel in free space. This is possible because of the equivalence that exists between the electromagnetic fields of two symmetric and oblique plane waves incident on and reflected from an infinite periodic surface and the incident/reflected fields that exist inside a single-mode rectangular waveguide containing a finite number of elementary cells. Comparisons of the measurements with some full-wave simulations for FSS belonging to the first three groups as they were defined by Munk confirm the good agreement between them. This is an interesting and simple assessment tool concerning the fabrication quality of FSS. The extension of this technique to non-symmetric FSS patterns is also discussed and supported by experimental and simulation results. The limitations of the technique are finally discussed.