Abstract
A new approach is proposed to obtain the dispersion characteristics of finite-extent photonic crystals. The method provides (w - k) diagram and information on the effective constitutive parameters of the structure and is applicable for general photonic crystals, that is, 1D, 2D and 3D photonic crystals with any kind of defects. The method utilizes the reflection data due to an incident plane wave at a given frequency, collected at the front interface of the photonic crystal for different numbers of unit cells. The reflection data can be obtained either analytically or by means of simulations or measurements. The method is verified on 1D and 2D perfect photonic crystals and 1D photonic crystal with defect.
Published Version
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a call