Abstract
Argonne National Laboratory has established and implemented a coordinated set of characterization methods for coated-conductor specimens that can be applied in a manner compatible with further processing or utilization of the respective specimen. These characterization methods include measurements of superconductor transport properties, phase composition, microstructure, and epitaxy quality for YBCO-coated conductors that range in size up to multi-meters. Recent progress will be reported on the integrated application of Raman microscopy, magneto-optical imaging, and focused-ion-beam-assisted electron microscopy to a meter-length tape produced by SuperPower, Inc. This non-destructive, multifaceted characterization approach has allowed us to develop a seamless methodology for the interrogation of coated-conductor tapes during the course of sequential high-temperature treatments. The aim of this research effort is to identify performance-limiting defects, clarify their origin/cause, and prescribe methods to eliminate them during coated conductor manufacturing.
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