Characterization of CCD-based imaging X-ray detectors for diffraction experiments

Abstract

High-resolution CCD-based imaging detectors are successfully used in X-ray diffraction experiments. Some detectors are commercially available, others have been developed by research groups around the world. Reliable comparison of the performance must be based on thorough testing of all relevant characteristics of these detectors. We describe methods of measurements of detector parameters such as conversion gain, linearity, uniformity, point spread function, geometrical uniformity, dark current, and detective quantum efficiency. As an example for the characterization, test results of a single module fiberoptic taper/CCD X-ray detector will be presented. The projected performance of a large area, array detector consisting of 9 CCDs and fiberoptic taper modules, will be given. This new detector (the “Gold” detector) will be installed on Beamline X8C at the National Synchrotron Light Source at Brookhaven National Laboratory.