Characterization by X-Ray Diffraction of Non- <inline-formula> <tex-math notation="LaTeX">$c$</tex-math> </inline-formula>-Axis Epitaxial <inline-formula> <tex-math notation="LaTeX">${Bi}_{2}{Sr}_{2}{CaCu}_{2}{O}_{8+\delta}$</tex-math> </inline-formula> Thin Films

Abstract

Thin films of Bi 2 Sr 2 CaCu 2 O 8 (Bi-2212) with the non-c-axis (117) orientation were grown by MOCVD on (110) LaAlO 3 single crystal substrate. XRD θ - 2θ scans show that films contain also (119) and (011)Bi-2212 impurity grains. We propose and report characterization of the non-c-axis films by XRD φ - ψ scans. By this approach, the assumed theoretical film-substrate relationship of the (117) Bi-2212 grains is demonstrated experimentally. The result also confirms twinning in the span rooflike (117) Bi-2212 grains. The impurity (119) and (011) Bi-2212 grains are also rooflike and in-plane aligned according to film-substrate relation and AFM images so that the film can be considered in-plane epitaxial.