Abstract
Abstract The plastic deformations introduced in silicon carbide (SiC) single crystals after they had been sintered by hot isostatic pressing (HIP) have been investigated by atomic-force microscopy (AFM). The starting α-SiC single crystals, mainly consisting of 6H and 4H polytypes, were platelet shaped with an average diameter and thickness of 24.6 and 3.2 μm respectively. After HIP sintering for 1 h in a silicon nitride (Si3N4) matrix carried out at 2050°C and 180 MPa to produce dense composite bodies, the SiC platelets were freed from the composite microstructure by a chemical treatment using a dilute NaOH aqueous solution. They were then imaged by AFM. Nanometre resolution was obtained by a contamination tip grown in the scanning electron microscope. Besides the presence of macroplastic deformation observed in some cases up to 16%, the SiC platelets typically showed two kinds of plastic damage: impressions by Si3N4 grains (average depth, 45.5 nm) left on the top surfaces and shear slip along the basal p...
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