Abstract
It is generally difficult to characterize inert gases through chemical reactions due to their inert chemical properties. The phase interference-sensing system based on high-resolution surface plasmon resonance (SPR) has an excellent refractive index detection limit. Based on this, this paper presents a simple and workable method for the characterization and detection of inert gases. The phase of light for the present SPR sensor is more sensitive to the change in the external dielectric environment than an amplitude SPR sensor. The limit of detection (LOD) is usually in the order of 10−6 to 10−7 RIU, which is superior to LSPR (Localized Surface Plasmon Resonance) sensors and traditional SPR sensors. The sensor parameters are simulated and optimized. Our simulation shows that a 36 nm-thick gold film is more suitable for the SPR sensing of inert gases. By periodically switching between the two inert gases, helium and argon, the resolution of the system is tested. The SPR sensing system can achieve distinguishable difference signals, enabling a clear distinction and characterization of helium and argon. The doping of argon in helium has a detection limit of 1098 ppm.
Highlights
Inert gases are stable and often difficult to react with other substances
Because of the inactive chemical nature of inert gas, it is commonly used as a protective gas in industrial production and scientific research
It is hard to characterize them by direct chemical reactions
Summary
Inert gases are stable and often difficult to react with other substances. Because of the inactive chemical nature of inert gas, it is commonly used as a protective gas in industrial production and scientific research. Common indirect detection methods include emission spectroscopy [1], mass spectrometry [2], and gas chromatography [3,4]. These methods require some tedious and time-consuming steps. Emission spectroscopy requires the electrical or thermal excitation of inert gases. This process will increase the cost of detection; mass spectrometry detection instruments are bulky, have high detection costs, and require vacuum during detection, so the instrument needs to be evacuated to a vacuum state in advance. It is urgent to find a simple, fast, and low-cost characterization method
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