Abstract
O(I) (130 nm) and N(I) (120 nm) resonance line broadening in a variety of rf- and microwave- excited low-pressure helium discharge lamps of the type used in laboratory and atmospheric experiments has been characterized by a line-absorption-titration technique. A line-absorption model with variable emission line width is used to fit experimentally observed absorptions of ground state O and N produced in a discharge-flow apparatus where the concentrations of the absorbing atoms are indepedently determined by chemical titration. The observed broadening is in general non-thermal and the effect is more pronounced for the O(I) lamps, for which the degree of line broadening increases with decreasing lamp pressure and discharge power. The O(I) results are interpreted in terms of an excitation mechanism which includes electron-impact excitation of O and dissociative excitation of O 2 by helium metastables.
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