Abstract
A linear accelerator based source of coherent radiation, FLASH (Free-electron LASer in Hamburg) provides ultra-intense femtosecond radiation pulses at wavelengths from the extreme ultraviolet (XUV; lambda<100nm) to the soft X-ray (SXR; lambda<30nm) spectral regions. 25-fs pulses of 32-nm FLASH radiation were used to determine the ablation parameters of PMMA - poly (methyl methacrylate). Under these irradiation conditions the attenuation length and ablation threshold were found to be (56.9+/-7.5) nm and approximately 2 mJ*cm(-2), respectively. For a second wavelength of 21.7 nm, the PMMA ablation was utilized to image the transverse intensity distribution within the focused beam at mum resolution by a method developed here.
Highlights
PMMA ablation has been extensively investigated with conventional UV-Vis-IR lasers
These properties are the prerequisites for the characterization of focused soft x-ray laser beams using profile measurements of the crater created in PMMA
We demonstrate the use of PMMA ablation to determine the focal spot intensity distribution of the new FLASH XUV free electron laser [10]
Summary
PMMA ablation has been extensively investigated with conventional UV-Vis-IR lasers (see for example [1,2]). The PMMA material removal is governed by non-thermal processes and restricted to the irradiation spot and its closest vicinity. These properties are the prerequisites for the characterization of focused soft x-ray laser beams using profile measurements of the crater created in PMMA. We demonstrate the use of PMMA ablation to determine the focal spot intensity distribution of the new FLASH XUV free electron laser [10].
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