Characteristic Mapping for Ellipse Detection Acceleration

Abstract

It is challenging to characterize the intrinsic geometry of high-degree algebraic curves with lower-degree algebraic curves. The reduction in the curve's degree implies lower computation costs, which is crucial for various practical computer vision systems. In this paper, we develop a characteristic mapping (CM) to recursively degenerate 3n points on a planar curve of n th order to 3(n-1) points on a curve of (n-1) th order. The proposed characteristic mapping enables curve grouping on a line, a curve of the lowest order, that preserves the intrinsic geometric properties of a higher-order curve (ellipse). We prove a necessary condition and derive an efficient arc grouping module that finds valid elliptical arc segments by determining whether the mapped three points are colinear, invoking minimal computation. We embed the module into two latest arc-based ellipse detection methods, which reduces their running time by 25% and 50% on average over five widely used data sets. This yields faster detection than the state-of-the-art algorithms while keeping their precision comparable or even higher. Two CM embedded methods also significantly surpass a deep learning method on all evaluation metrics.