Abstract
Synthesis and characterization of hybrid materials (HMs) play a vital role in material science and engineering. The morphological features of HMs always gather extraordinary attention because of the influence of morphology on the HM properties. Microstructural characterization provides information about the morphology of HMs, which can be finely tuned based on its application. Thus a detailed investigation of the morphology of HMs and their effect on the electronic, optical, thermal, and electrical properties is required. Various morphological characterization techniques such as atomic force microscopy, scanning electron microscopy, and transmission electron microscopy can be used to evaluate the morphology of HMs. This chapter introduces different techniques used to identify and characterize the morphology of HMs. Besides, some selected examples are highlighted for each technique.
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