Abstract
This chapter discusses the scanning probe microscopy and dislocations. The work principle of this recent technique is briefly discussed in the chapter and its potential is compared to classical dislocation imaging techniques. Some relevant studies by scanning probe microscopies are then presented to illustrate the surface topography that can be found in the vicinity of dislocations. It is here worth noting that this chapter is restricted to Scanning Tunneling Microscopy and Atomic Force Microscopy but there are other related scanning probe microscopies that can be used to study dislocations. The potential of this technique is evidenced to analyze the fine structure of slip lines and to give interesting information about plastic mechanisms taking place in the bulk crystal.
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