Abstract
We describe the use of total scattering atomic pair distribution function (PDF) methods to study the nanoscale structure of semiconductors. We give a broad introduction to the method and illustrate the kind of information that can be obtained by using a number of examples where the method has been applied to semiconductors. In particular, the approach yields valuable information beyond crystallography about the local structure, defects and atomic disorder, nanoscale substructures in bulk materials, and the atomic structure, size, defects, and strain of tiny nanoparticles (NPs).
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