Abstract
Electron microscopy has brought a revolution in the imaging of samples with high resolution and clarity. There are mainly two types of electron microscopy: SEM and TEM. SEM allows the imaging of the surface morphology of the sample while TEM allows the internal morphology of a cell to be visualized. The sample preparation techniques of both instruments are varied. The instruments are also operated in various modes of imaging in order to increase the resolution, contrast, and focus. Electron microscopes are highly useful for the analysis of forensic evidence as they are capable of focusing on minute details in a very small amount of sample. In this chapter, the principle and theory of electron microscopes and their applications in the analysis of forensic evidence are discussed.
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