Abstract
Nanomaterials (NMs) are an important part of nanoscience and nanotechnology, which became not only an important and active area of research, but also an economic sector in full expansion in many application domains. The enhancement of useful properties (e.g., self-healing, self-cleaning, anti-freezing, and antibacterial) are the result of careful investigation of the produced NMs. An accurate and precise characterization of NMs with regard to the intended application is important. Characterization techniques have been developed as faster than nanosciences and nanotechnology, but they will continue improving. Actually, characterization techniques not only provide images, but also can also provide fundamental information regarding the composition and properties of NMs all the way down to the atoms. This chapter presents information about dynamic light scattering (DLS), Brunauer–Emmett–Teller (BET) surface area, ultraviolet-–visible (UV-vis) spectroscopy, photoluminescence spectroscopy (PLS), fluorescence spectroscopy (FS), dielectric spectroscopy (DS), and magnetic measurements, along with brief description of strengths and limitations of each technique, is discussed.
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