Abstract
The effects of scanning a 2 MeV alpha beam and a 3 MeV proton beam on organic targets were investigated. As organic materials we chose ∼ 1 μm thick Elvamide nylon and ∼ 2.5 μm thick mylar foils. Elemental concentrations were measured using unscanned and continuously scanned microbeams for different areas (from ∼ 20 × 20 μm 2 up to ∼ 100 × 100 μm 2) with frequencies from ∼ 10 to ∼ 1000 Hz. Scanning transmission ion microscopy (STIM) measurements were made before and after scanning to observe changes in the areal density of the samples.
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