Abstract
The electric field distributions in loaded dielectric layers of multilayer ceramic capacitors were investigated at several stages of insulation degradation for the load, using Kelvin probe force microscopy. The electric field distribution was found to be different at each stage of loaded time. Initially, the electric field was concentrated near the cathode, indicating that the insulation resistance near the anode decreased. Then, following the homogeneous distribution shown for an intermediate stage, the electric field eventually concentrated near the anode. This change indicates how insulation degradation occurs locally; this change can plausibly be explained by a hole density increase.
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