Abstract

Measurement of photoelectrons excited by X-ray standing waves (X.S.W.) is shown to provide a highly sensitive technique for structural investigation of surface layers in garnets. The results may be combined with a study of the same layer by Conversion Electron Mossbauer Spectroscopy (C.E.M.S.) which mainly gives information on the magnetic properties. The combined use of these two techniques is demonstrated on an epitaxial film of yttrium iron garnet. In particular, X.S.W. photoelectron yield curves are calculated for different site occupancies of the excited atoms and in case of a damaged layer. Theory is compared with experiment, in which a high-efficiency electron counter is utilized. Finally, the C.E.M.S. spectrum of the same layer is presented and discussed.

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