Abstract
We report cumulative results on CW Nd:YAG laser deposition of CdS thin films. Films are characterized by X-ray diffraction, scanning electron microscopy, energy dispersive X-ray analysis, transmission electron microscopy, ultraviolet through visible light transmission, and Raman measurements. Films deposited at 400 °C or higher manifest a pure hexagonal CdS phase, and films deposited at 200 °C or lower contain both cubic and hexagonal phases.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
