Abstract
Cadmium self-doped CdTe polycrystalline films were grown on Corning glass substrates at room temperature by cosputtering from a CdTe–Cd target. The electrical, structural, and optical properties of the films were analyzed as a function of the Cd concentration. Films with a stoichiometric composition, and slightly below and above it, were prepared. In films where the Te exceeds 50 at. %, it is found segregation of Te and its electrical resistivity is about 107 Ω cm. In those with an excess of Cd, the electrical resistivity drops several orders of magnitude, the carrier concentration increases, and the resistivity activation energy drops. From these results, we concluded that using this deposition method, n-type Cd self-doped CdTe polycrystalline films can be produced.
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