Abstract
Negative temperature coefficient (NTC) ceramics with general composition Ni0.6Mn2Si0.4-xAlxO4 (0≤x≤0.04) were prepared by conventional solid-state reaction method and were investigated for cationic distribution and electrical properties. X-ray diffraction (XRD) confirmed that the Si cations occupied the tetrahedral site. The valence states of Mn ions were characterized by X-ray photoelectron spectral (XPS). The results showed that Mn4+ content decreased from 0.19 mol to 0.185 mol when the Si molar content declined from 0.4 to 0.1, i.e. the content of Mn4+ was 0.197mol when x was equal to 0.4. Besides, the resistivity (ρ25) reached the minimum value when the Si molar content was 0 (ρ25=4.07×104Ω·cm).
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