Abstract
SrBi2Nb2O9 (SBN) films were grown by pulsed laser deposition on (100) and (110) Pt epitaxial bottom layers. In both cases x-ray diffraction evidenced the epitaxial growth of SBN in spite of the coexistence of mainly two orientations. SBN films on (100) Pt present usually a dominant (001) orientation with the (115) one. AFM piezoresponse images agree with the crystallographic data, i.e. only the (115) oriented grains show a piezoelectric contrast. The SBN films grown on (110) Pt lead to a more homogenous piezoresponse imaging, in agreement with the preferential (116) orientation and the microstructure.
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