Abstract
We measure the minority carrier lifetime of perovskite films by differential microwave photoconductivity decay (μ-PCD). Clear decay curves can be detected from bare and laminated methylammonium lead iodide (MAPbI3) films by the differential μ-PCD. The degradation of the bare and laminated MAPbI3 films under air exposure at room temperature is clearly observed as the continuous change of the decay curves. The differential μ-PCD can thus be a quick and non-destructive method for the characterization of the electrical quality of perovskite films and modules.
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