Abstract
The impact of capacitor switching on transformer transients is evaluated. Two specific transformer failure events are described. Each of these failures coincided with the switching of a capacitor bank some distance away from the transformer. The causes of these failures are evaluated, and field-test transient voltage waveforms are duplicated by computer simulations. The simulation capability is extended to determine system conditions that are susceptible to these transient voltages as well as the means to minimize them.< <ETX xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">></ETX>
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