Abstract
Abstract We have demonstrated a simple and accurate method for characterizing the capacitance of Graphene/n-Si Schottky junction solar cells (GSSCs) which embed the metal-oxide-semiconductor (MOS) capacitor. We measured two types of GSSCs, one with thermal annealing treatments (w-a) and one without (wo-a). It was found that the wo-a GSSC exhibits a two-step feature in the phase versus forward bias voltage relationship, which may be attributed to the presence of polymethyl methacrylate residues. By considering the capacitance of the MOS capacitor (Cmos) and its standard deviation, we successfully obtained the capacitance of the Schottky junction (CSch), and evaluated meaningful built-in potentials (Schottky barrier heights) which are 0.51 V (0.78 eV) and 0.47 V (0.75 eV) for the w-a and wo-a GSSCs, respectively, by the Mott–Schottky analysis. We also briefly discuss the relationship between CSch and the Nyquist and Bode plots, finding that the RC time constant decreases due to the subtraction of Cmos.
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