Abstract
An attempt has been made to image prospective tips by atomic force microscopy. The apex of mounted diamond fragments and of traditional metallic tips was investigated by the same diamond probe. The peculiar tip–tip configuration allowed to search for the effect of sample rotation on the images. Identical images were obtained when the diamond stylus scanned different etched tungsten tips, illustrating an interchange in the roles of tip and sample.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callMore From: Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures Processing, Measurement, and Phenomena
Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
