Abstract
Setups developed for the calibration of X-ray streak cameras and of elements of X-ray measuring circuits are described. Calibration procedures are described and calibration results related to the absolute spectral sensitivity, spatial resolution, distortion, sensitivity nonuniformity over the screen, sweep speed and nonlinearity of an X-ray streak camera, as well as the results of the calibration of filters and mirrors used in recording laser-plasma X-rays are presented. The absolute-calibration error for the streak camera is within ±10%, and the calibration error for the filter and mirrors is within ±2%. Methods for processing photochronograms are described that, using the calibration data, allow the correction of distortions introduced by the streak camera.
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