Abstract
To tie the wavelengths of γ-rays to a visible standard is a key element of accurate determinations of the Planck constant and of tests of the Einstein mass–energy equivalence. This link is achievedviasmall diffraction angle measurements and perfect single crystals, the lattice parameter of which is determined by combined X-ray and optical interferometry. The present paper concerns the lattice parameter measurement of an Si crystal, of a natural isotopic composition, designed to be used both as the analyser crystal of an X-ray interferometer and the reference grating of a γ-ray spectrometer.
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