Calibration and efficient evaluation of electromigration lifetime for interconnect wire sizing of multi-port networks

Abstract

A canonical form of the hydrostatic stress equations for electromigration is proposed to determine the minimum number of parameters to calibrate the model. An efficient probabilistic lifetime checker is developed to determine the wire sizing of interconnect segments. Large networks can be checked on a segment-by-segment basis. To enable efficient evaluation of lifetime, multivariate models are constructed by precomputing the results for all possible interconnect segment geometries, model parameters, and current densities.