7-days of FREE Audio papers, translation & more with Prime
7-days of FREE Prime access
7-days of FREE Audio papers, translation & more with Prime
7-days of FREE Prime access
https://doi.org/10.1364/qo.1995.qthe18
Copy DOIPublication Date: Jan 1, 1995 |
During recent years the intensity noise in semiconductor lasers has received considerable attention. This is mainly due to the theoretical predictions [1] and experimental results [2-7] indicating that sub-shot-noise levels, amplitude squeezing, can be obtained if the pump noise is suppressed using a high impedance injection current. Recent results indicate, however, that multimode operation in semiconductor lasers may render increased noise levels in spite of the low pump noise [4-7]. The intensity noise of vertical-cavity surface emitting-lasers VCSELs has been reported in refs. [8] and [9]. In [8] the polarization stability of GaAlAs-GaAs VCSELs was examined and the effect of mode partition between the two polarizations was observed. However, to the best of our knowledge, measurements where the VCSEL noise is directly compared to the fundamental shot-noise level have not yet been reported.
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.