Abstract

The two-parameter-fitting method (PFM) is commonly used to calculate the stopping-power ratio (SPR). This study proposes a new formalism: a three-PFM, which can be used in multiple spectral computed tomography (CT). Using a photon-counting CT system, seven rod-shaped samples of aluminium, graphite, and poly(methyl methacrylate) (PMMA), and four types of biological phantom materials were placed in a water-filled sample holder. The X-ray tube voltage and current were set at 150 kV and 40 A respectively, and four CT images were obtained at four threshold settings. A semi-empirical correction method that corrects the difference between the CT values from the photon-counting CT images and theoretical values in each spectral region was also introduced. Both the two- and three-PFMs were used to calculate the effective atomic number and electron density from multiple CT numbers. The mean excitation energy was calculated via parameterisation with the effective atomic number, and the SPR was then calculated from the calculated electron density and mean excitation energy. Then, the SPRs from both methods were compared with the theoretical values. To estimate the noise level of the CT numbers obtained from the photon-counting CT, CT numbers, including noise, were simulated to evaluate the robustness of the aforementioned PFMs. For the aluminium and graphite, the maximum relative errors for the SPRs calculated using the two-PFM and three-PFM were 17.1% and 7.1%, respectively. For the PMMA and biological phantom materials, the maximum relative errors for the SPRs calculated using the two-PFM and three-PFM were 5.5% and 2.0%, respectively. It was concluded that the three-PFM, compared with the two-PFM, can yield SPRs that are closer to the theoretical values and is less affected by noise.

Highlights

  • An X-ray computed tomography (CT) image is a map of the photon linear attenuation coefficient, which is usually calculated as the sum of the cross-sectional contributions of the photoelectric effect, Compton scattering, and Rayleigh scattering

  • The stoppingpower ratio (SPR) was calculated using a photon-counting CT system after multiple CT numbers were obtained at each threshold

  • To calculate the effective atomic number and electron density, we developed a new method, namely, three-parameter-fitting method (PFM), applicable to multiple spectral CT to improve upon the conventional method, namely, two-PFM

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Summary

Introduction

An X-ray computed tomography (CT) image is a map of the photon linear attenuation coefficient, which is usually calculated as the sum of the cross-sectional contributions of the photoelectric effect, Compton scattering, and Rayleigh scattering. Some projections are hardened, such that the amount of detection can vary because of changes in the average X-ray energy [4,8,9,10] In this case, beam-hardening artefacts in CT images directly affect the effective atomic number and electron density calculation

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