Calculation of single-event characteristics for voltage dip based on the goodness of fit test

Abstract

The typical single-event characteristics of a voltage dip include residual voltage, duration, dip type, point-on-wave and phase-angle jump, which may influence the operation of the sensitive equipment under voltage dip. This operation is the foundation on which the single-event characteristics of a voltage dip can be accurately calculated to mitigate the voltage dip. The challenge of existing studies is that no unified and systematic method to calculate multiple single-event characteristics. This study proposes a robust adaptive method based on Goodness-of-Fit (GoF) test to calculate the characteristics of a voltage dip. First, a calculation method for the transition segment of voltage dip is proposed based on the GoF test. Then, four methods are presented for calculating four different characteristics of the dip based on the detected transition segment. The proposed method is subsequently unified and thus reduces the computation of monitor devices. Moreover, this method can adaptively adjust the critical value according to the sampling rate, avoiding the influence of noise. Finally, this study applies 516 sets of measured voltage dips to verify the performance of the proposed method, comparing the results with that of the existing methods.