Abstract
Layered ZnS/<TEX>$CaF_2$</TEX>/ZnS/Cu film was deposited on glass substrate by using evaporation method. ZnS and <TEX>$CaF_2$</TEX> were chosen as high and low refractive materials. Cu was used as mid-reflective layer. Reflectance with different optical thickness of <TEX>$CaF_2$</TEX> ranging from <TEX>$0.25{\lambda}\;to\;0.5{\lambda}$</TEX> were systematically investigated by using spectrophotometer. In order to expect the experimental results, the simulation program, the Essential Macleod Program(EMP) was adopted and compared with the experimental data. Based on the results taken by spectrophotometer, the ZnS/<TEX>$CaF_2$</TEX>/ZnS/Cu multi-layered thin film show the maximum reflectance of 80% at 625nm <TEX>$(0.25{\lambda}\;in\;CaF_2)$</TEX> and 42% at 660nm <TEX>$(0.5{\lambda}\;in\;CaF_2)$</TEX> respectively. As compared with the experimental results and simulation data, it was confirmed the experimental data is well matched with the EMP data.
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