Abstract


 
 
 
 Background: The three cadmium(II) chalcogenides CdX (X = S, Se, Te; Cadmium with either Sulphur, Se- lenium, or Tellurium), have important applications as artists’ pigments and in the electronics industry. The purpose of this study is to assess the structural stabilities of bulk, microcrystalline samples of the three cadmium(II) chalcogenides over a wide temperature range by examining the changes that occur in their Raman spectra.
 
 
 
 
 Methods: We recorded the Raman spectra of the three cadmium(II) chalcogenides from -196 °C to 500 °C on a commercial instrument equipped with a microscope and a variable-temperature stage.
 
 
 
 
 
 
 Results: While the Raman spectra of all three cadmium(II) chalcogenides exhibited significant peak shifts and broadening with increasing temperature, these effects were completely reversible. There is no evidence of phase transitions, indicating structural stability.
 Conclusion: Taken together, our results show that the three cadmium(II) chalcogenides are resistant to structural changes throughout the almost -700 °C temperature range investigated, thereby reinforcing their continued use in artwork and in the electronics industry.
 
 
 
 
 
 
 
 
 
 
 

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